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 ASCEND Semiconductor 4Mx4 EDO Data sheet
Rev.1
Page 1
AD 40 4M 4 2 V S A - 5
Ascend Semiconductor
EDO/FPM D-RAMBUS DDRSDRAM DDRSGRAM SGRAM SDRAM
: : : : : :
40 41 42 43 46 48
Density 16M : 16 Mega Bits 8M : 8 Mega Bits 4M : 4 Mega Bits 2M : 2 Mega Bits 1M : 1 Mega Bit Organization 4: x4 8 : x8 9 : x9 16 : x16 18 : x18 32 : x32 Refresh 1 : 1K 8 : 8K 2 : 2K 6 :16K 4 : 4K
Min Cycle Time ( Max Freq.) -5 : 5ns ( 200MHz ) -6 : 6ns ( 167MHz ) -7 : 7ns ( 143MHz ) -75 : 7.5ns ( 133MHz ) -8 : 8ns ( 125MHz ) -10 : 10ns ( 100MHz ) EDO : -5 (50 ns) -6 (60 ns)
Revision A : 1st B : 2nd C : 3rd D :4th
Interface V: 3.3V R: 2.5V
Package C: CSP B: uBGA T: TSOP Q: TQFP P: PQFP ( QFP ) L: LQFP S: SOJ
Rev.1
Page 2
Description
The device CMOS Dynamic RAM organized as 4,194,304 words x 4 bits with extended data out access mode. It is fabricated with an advanced submicron CMOS technology and designed to operate from a single 3.3V oniy power supply. Low voltage operation is more suitable to be used on battery backup, portable electronic application. lt is packaged in JEDEC standard 26/24-pin plastic SOJ or TSOP(II).
Features
* Single 3.3V( 10 %) only power supply * High speed tRAC acess time: 50/60ns * Low power dissipation - Active mode : 432/396 mW (Mas)
- Standby mode: 0.54 mW (Mas) * Extended - data - out(EDO) page mode access * I/O level: CMOS level (Vcc = 3.3V) * 2048 refresh cycle in 32 ms(Std.) or 128 ms(S-version) * 4 refresh modesh: - RAS only refresh - CAS - before - RAS refresh - Hidden refresh - Self-refresh(S-version)
Rev.1
Page 3
Pin Configuration 26/24-PIN 300mil Plastic SOJ
26/24-PIN 300mil Plastic TSOP (ll)
VCC DQ1 DQ2 WE RAS NC A10 A0 A1 A2 A3 VCC
1 2 3 4 5 6 8 9 10 11 12 13
26 25 24 23 22 21 19 18 17 16 15 14
VSS DQ4 DQ3 CAS OE A9 A8 A7 A6 A5 A4 VSS
VCC DQ1 DQ2 WE RAS NC A10 A0 A1 A2 A3 VCC
1 2 3 4 5 6 8 9 10 11 12 13
26 25 24 23 22 21 19 18 17 16 15 14
VSS DQ4 DQ3 CAS OE A9 A8 A7 A6 A5 A4 VSS
AD404M42VT
AD404M42VS
Pin Description Pin Name A0-A10 Function Address inputs - Row address - Column address - Refresh address Data-in / data-out Row address strobe Column address strobe Write enable Output enable Power (+ 3.3V) Ground A0-A10 A0-A10 A0-A10
DQ1~DQ4 RAS CAS WE OE Vcc Vss
Rev.1
Page 4
Block Diagram
WE
CAS
CONTROL LOGIC
DATA-IN BUFFER DQ1 . . DQ4
NO. 2 CLOCK GENERATOR
DATA-OUT BUFFER OE
COLUMN ADDRESS BUFFERS (11) A0 A1 A2 A3 A4 A5 A6 A7 A8 A9
ROW DECODER
COLUMN DECODER
REFRESH CONTROLLER
2048
SENSE AMPLIFIERS I/O GATING REFRESH COUNTER 2048x4
A10
ROW ADDRESS BUFFERS (11)
2048x2048x4 MEMORY ARRAY
2048
RAS
NO. 1 CLOCK GENERATOR
Vcc Vss
Rev.1
Page 5
TRUTH TABLE
ADDRESSES FUNCTION RAS STANDBY READ WRITE: (EARLY WRITE ) READ WRITE EDO-PAGEMODE READ 1st Cycle 2nd Cycle EDO-PAGE 1st Cycle MODE WRITE 2nd Cycle EDOPAGE-MODE READ-WRITE HIDDEN REFRESH 1st Cycle 2nd Cycle READ WRITE RAS-ONLY REFRESH CBR REFRESH H L L L L L L L L L LHL LHL L HL CAS HX L L L HL HL HL HL HL HL L L H L WE X H L HL H H L L HL HL H L X H OE X L X LH L L X X ROW X ROW ROW ROW ROW n/a ROW n/a ROW n/a ROW ROW ROW X COL X COL COL COL COL COL COL COL COL COL COL COL n/a X High-Z Data-Out Data-ln Data-Out,Data-ln Data-Out Data-Out Data-In Data-In Data-Out, Data-In Data-Out, Data-In Data-Out Data-In High-Z High-Z 1 DQS Notes
LH LH
L X X X
Notes: 1. EARLY WRITE only.
Rev.1
Page 6
Absolute Maximum Ratings
Parameter Voltage on any pin relative to Vss Supply voltage relative to Vss Short circuit output current Power dissipation Operating temperature Storage temperature
Symbol VT VCC IOUT PD TOPT TSTG
Value -0.5 to + 4.6 -0.5 to + 4.6 50 1.0 0 to + 70 -55 to + 125
Unit V V mA W
C C
Recommended DC Operating Conditions
Parameter/Condition
Symbol Min
3.3 Volt Version Typ 3.3 Max 3.6
Unit
Supply Voltage Input High Voltage, all inputs Input Low Voltage, all inputs
VCC VIH VIL
3.0 2.0 -0.3
V V V
- VCC + 0.3 0.8
Capacitance Ta = 25C, VCC = 3.3V 10 %, f = 1MHz
Parameter Input capacitance (Address) Input capacitance (RAS, CAS, OE, WE) Output capacitance (Data-in, Data-out)
Symbol CI1 CI2 CI/O
Typ -
Max 5 7 7
Unit pF pF pF
Note 1 1 1, 2
Note: 1. Capacitance measured with effective capacitance measuring method. 2. RAS, CAS = V IH to disable Dout.
Rev.1
Page 7
DC Characteristics : (Ta = 0 to 70C, VCC = + 3.3V 10 %, VSS = 0V)
Parameter
Symbol
Test Conditions -5 Min
AD404M42V -6 Max 120 Min Max 110
Unit
Notes
Operating current
ICC1
RAS cycling CAS, cycling tRC = min LVTTL interface RAS, CAS = VIH Dout = High-Z CMOS interface RAS, CAS V C C -0.2V Dout = High-Z
-
mA
1, 2
Low power S-version
ICC2
-
0.5
-
0.5
mA
-
0.15
-
0.15
mA
Standby Current
Standard power version
LVTTL interface RAS, CAS = VIH Dout = High-Z CMOS interface RAS, CAS V C C -0.2V Dout = High-Z
-
2
-
2
mA
-
0.5
-
0.5
mA
RAS- only refresh current EDO page mode current CAS- before- RAS refresh current Self- refresh current (S-Version)
ICC3 ICC4 ICC5 ICC8
RAS cycling, CAS = VIH tRC = min tPC = min tRC = min RAS, CAS cycling t RASS 100s
-
120 90 120 550
-
110 80 110 550
mA mA mA A
1, 2 1, 3 1, 2
Rev.1
Page 8
DC Characteristics : (Ta = 0 to 70C, VCC= +3.3V 10 %, VSS= 0V) AD404M42V -5 Parameter Input leakage current Output leakage current Symbol ILI ILO VOH VOL Test Conditions 0V Vin V C C + 0.3V 0V Vout V CC + 0.3V Dout = Disable Output high Voltage Output low voltage IOH = -2mA IOL = +2mA 2.4 0.4 2.4 0.4 V V Min -5 -5 Max 5 5 Min -5 -5 -6 Max 5 5 A A Unit Notes
Notes: 1. ICC is specified as an average current. It depends on output loading condition and cycle rate when the device is selected. ICC max is specified at the output open condition. 2. Address can be changed once or less while RAS = VIL. 3. For I CC4, address can be changed once or less within one EDO page mode cycle time.
Rev.1
Page 9
AC Characteristics (T a = 0 to + 70C, Vcc = 3.3V 10 %, Vss = 0V) *1, *2, *3, *4
Test conditions * Output load: one TTL Load and 100pF (VCC = 3.3V 10 %) * Input timing reference levels: VIH = 2.0V, VIL = 0.8V (VCC = 3.3V 10 %) * Output timing reference levels: VOH = 2.0V, VOL = 0.8V
Read, Write, Read- Modify- Write and Refresh Cycles (Common Parameters) AD404M42V -5 Parameter Random read or write cycle time RAS precharge time CAS precharge time in normal mode RAS pulse width CAS pulse width Row address setup time Row address hold time Column address setup time Column address hold time RAS to CAS delay time RAS to column address delay time Column address to RAS lead time RAS hold time CAS hold time CAS to RAS precharge time OE to Din delay time Transition time (rise and fall) Refresh period Refresh period (S- Version) CAS to output in Low- Z CAS delay time from Din OE delay time from Din Symbol tRC tRP tCPN tRAS tCAS tASR tRAH tASC tCAH tRCD tRAD tRAL tRSH tCSH tCRP tOED tT tREF tREF tCLZ tDZC tDZO Min 84 30 10 50 8 0 8 0 8 12 10 25 8 38 5 12 1 0 0 0 Max 10000 10000 37 25 50 32 128 Min 104 40 10 60 10 0 10 0 10 14 12 30 10 40 5 15 1 0 0 0 -6 Max 10000 10000 45 30 50 32 128 ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ms ms ns ns ns 11 10 8 9 7 5 6 Unit Notes
Rev.1
Page 10
Read Cycle AD404M42V -5 Parameter Access time from RAS Access time from CAS Access time from column address Access time from OE Read command setup time Read command hold time to CAS Read command hold time to RAS Output buffer turn-off time Output buffer turn-off time from OE Symbol tRAC tCAC tAA tOEA tRCS tRCH tRRH tOFF tOEZ Min 0 0 0 0 0 Max 50 14 25 12 12 12 Min 0 0 0 0 0 -6 Max 60 15 30 15 15 15 ns ns ns ns ns ns ns ns ns 7 10, 16 16 17 17 12 13, 14 14, 15 Unit Notes
Write Cycle AD404M42V -5 Parameter Write command setup time Write command hold time Write command pulse width Write command to RAS lead time Write command to CAS lead time Data-in setup time Data-in hold time WE to Data-in delay Symbol tWCS tWCH tWP tRWL tCWL tDS tDH tWED Min 0 8 8 13 8 0 8 10 Max Min 0 10 10 15 10 0 10 10 -6 Max ns ns ns ns ns ns ns ns 19 19 7, 18 Unit Notes
Rev.1
Page 11
Read- Modify- Write Cycle AD404M42V -5 Parameter Read-modify- write cycle time RAS to WE delay time CAS to WE dealy time Column address to WE delay time OE hold time from WE Symbol tRWC tRWD tCWD tAWD tOEH Min 108 64 26 39 8 Max Min 133 77 32 47 10 -6 Max ns ns ns ns ns 18 18 18 Unit Notes
Refresh Cycle
AD404M42V -5 Parameter CAS setup time (CBR refresh) CAS hold time (CBR refresh) RAS precharge to CAS hold time RAS pulse width (self refresh) RAS precharge time (self refresh) CAS hold time (CBR self refresh) WE setup time WE hold time Symbol tCSR tCHR tRPC tRASS tRPS tCHS tWSR tWHR Min 5 8 5 100 90 -50 0 10 Max Min 5 10 5 100 110 -50 0 10 -6 Max Unit ns ns ns s ns ns ns ns 10 7 Notes
Rev.1
Page 12
EDO Page Mode Cycle AD404M42V -5 Parameter EDO page mode cycle time EDO page mode CAS precharge time EDO page mode RAS pulse width Access time from CAS precharge RAS hold time from CAS precharge OE high hold time from CAS high OE high pulse width Data output hold time after CAS low Output disable delay from WE WE pulse width for output disable when CAS high Symbol tPC tCP tRASP tCPA tCPRH tOEHC tOEP tCOH tWHZ tWPZ Min 20 10 50 30 5 10 5 3 7 Max 105 30 10 Min 25 10 60 35 5 10 5 3 7 -6 Max 105 35 10 Unit ns ns ns ns ns ns ns ns ns ns 20 10, 14 Notes
EDO Page Mode Read Modify Write Cycle AD404M42V -5 Parameter EDO page mode read- modify- write cycle CAS precharge to WE delay time EDO page mode read- modify- write cycle time Symbol tCPW tPRWC Min 45 56 Max Min 55 68 -6 Max Unit ns ns Notes 10
Rev.1
Page 13
Notes : 1. AC measurements assume t T = 2ns. 2. An initial pause of 100 s is required after power up, and it followed by a minimum of eight initialization cycles (RAS - only refresh cycle or CAS - before - RAS refresh cycle). If the internal refresh counter is used, a minimun of eight CAS - before - RAS refresh cycles are required. 3. In delayed write or read-modify-write cycles, OE must disable output buffer prior to applying data to the device. 4. All the VCC and VSS pins shall be supplied with the same voltages. 5. tRAS(min) = tRWD(min)+t RWL(min)+tT in read-modify-write cycle. 6. tCAS (min) = tCWD(min)+tCWL(min)+tT in read-modify-write cycle. 7. tASC(min), tRCS (min), tWCS(min), and tRPC are determined by the falling edge of CAS . 8. t RCD(max) is specified as a reference point only, and tRAC (max) can be met with the tRCD(max) limit. Otherwise, tRAC is controlled exclusively by tCAC if tRCD is greater than the specified tRCD(max) limit. 9. tRAD(max) is specified as a reference point only, and tRAC(max) can be met with the tRAD(max) limit. Otherwise, tRAC is controlled exclusively by tAA if tRAD is greater than the specified tRAD(max) limit. 10. tCRP, tCHR , tRCH, tCPA and tCPW are determined by the rising edge of CAS . 11. V IH(min) and VIL(max) are reference levels for measuring timing or input signals. Therefore, transition time is measured between VIH and VIL. 12. Assumes that t RCD
tRCD(max) and tRAD
tRAD(max). If t RCD or tRAD is greater than the maximum
recommended value shown in this table, tRAC exceeds the value shown. 13. Assumes that tRCD
t RCD (max) and tRAD t RAD (max). tRAD (max).
14. Access time is determined by the maximum of tAA , tCAC, tCPA. 15. Assumes that t RCD tRCD (max) and t RAD
16. Either tRCH or tRRH must be satisfied for a read cycle. 17. tOFF(max) and tOEZ(max) define the time at which the output achieves the open circuit condition (high impedance). t OFF is determined by the later rising edge of RAS or CAS. 18. tWCS, tRWD, tCWD, and tAWD are not restrictive operating parameters. They are included in the data sheet as electrical characteristics only. If tWCS t WCS (min), the cycle is an early write cycle and the data out will remain open circuit (high impedance) throughout the entire cycle. If tRWD tCWD
tRWD (min),
t CWD (min),
t AWD
t AWD (min) and
tCPW
tCPW (min), the cycle is a read-modify-write and
the data output will contain data read from the selected cell. If neither of the above sets of conditions is satisfied, the condition of the data output (at access time) is indeterminate. 19. These parameters are referenced to CAS separately in an early write cycle and to WE edge in a delayed write or a read-modify-write cycle. 20. tRASP defines RAS pulse width in EDO page mode cycles.
Rev.1
Page 14
Timing Waveforms * Read Cycle
t RC t RAS t RP
RAS
t CRP t CSH t RCD t T t RSH t CAS t CPN
CAS
t RAD
t RAL
t ASR
t RAH Row
t ASC
t CAH Column t RRH
ADDRESS
t RCS
t RCH
WE
OE
t OEA t CAC t AA t RAC t OEZ t OFF t OFF
DQ1~DQ4
t CLZ Note : = don't care = Invalid Dout
D OUT
Rev.1
Page 15
*Early Write Cycle
t RC t RAS t RP
RAS
t CSH t RCD t T t RSH
t CRP
t CPN t CAS
CAS
t RAD t ASR t RAH Row t ASC t CAH
t RAL
ADDRESS
Column
t RAL
t WCS
t WCH
WE
t DS
t DH
DQ1~DQ4
DIN
Rev.1
Page 16
* Delayed Write Cycle
t RC t RAS t RP
RAS
t CSH t RCD t T t RSH t CAS
t CRP
t CPN
CAS
t ASR
t RAH
t ASC
t CAH
ADDRESS
Row
Column
t CWL t RCS t RWL t WP
WE
t OED
t OEH
OE
t DS
t DS
t DH
DQ1~DQ4
OPEN
DIN
Rev.1
Page 17
* Read - Modify - Write Cycle
t RWC t RAS t RP
RAS
t T t RCD t CAS t CRP t CPN
CAS
t RAD t ASR t RAH t ASC t CAH
ADDRESS
Row
Column t RCS t CWD t AWD t RWD t CWL t RWL t WP
WE
t DZC t DS
t DH
DQ1~DQ4
OPEN
DIN
t DZO
t OED
t OEH
OE
t OEA t CAC t AA t OEZ
t RAC
DQ1~DQ4
DOUT
Rev.1
Page 18
* EDO Page Mode Read Cycle
t RASP t CPRH t RP
RAS
t CRP t CSH t CRP t RCD t CAS t CP t PC t CAS t CP t RSH t CAS t CPN
CAS
t RAD t ASR t RAH t ASC t CAH t ASC t CAH t ASC
t RAL t CAH
ADDRESS
Row
Column 1
Column 2
Column N
Row
t RCS
t RRH t RCH
WE
WE
t OEHC t OEA t OEP t OEA
OE
OE
t RAC t AA t CPA t AA t CPA t AA t OEZ t CAC t CAC t COH t CAC t OFF t OEZ
t OFF
DQ1~DQ4
DOUT 1 DOUT 2
DOUT N
OPEN
Rev.1
Page 19
* EDO Page Mode Early Write Cycle
t
RASP
t RP
RAS
tT t CSH t RCD t CAS t CP t PC t CAS t CP t RSH t CAS
t CRP t CPN
CAS
t ASR
t RAH
t ASC
t CAH
t ASC
t CAH
t ASC
t CAH
ADDRESS
Row
Column 1
Column 2
Column N
t WCS
t WCH
t WCS
t WCH
t WCS
t WCH
WE
WE
t DS
t DH
t DS
t DH
t DS
t DH
DQ1~DQ4
DIN 1
DIN 2
DIN N
Rev.1
Page 20
* EDO Page Mode Read-Early-Write Cycle
t RASP t CPRH t RP
RAS
t CRP t CSH t CRP t RCD t CAS t CP t PC t CAS t CP t RSH t CAS t CPN
CAS
t CSH t RAD t ASR t RAH t ASC t RAH t ASC t CAH t ASC t CAL t RAL t CAH
ADDRESS
Row
Column 1
Column 2
Column N
Row
t RCS
t RCH
t WCS t WCH
WE
WE
t OEA t WED
OE
OE
t RAC t AA t CPA t AA t WHZ t CAC t COH t CAC t DS
Data Doutput 2 Data Input N
t DH
DQ1~DQ4
OPEN
Data Doutput 1
Rev.1
Page 21
* EDO Page Mode Read-Modify-Write Cycle
t RASP tCPRH t RP
RAS
t T t RCD t CAS t CP
t PRWC t CAS t CP t CAS
t CRP
CAS
t RAD t ASR t RAH t ASC t CAH t ASC t CAH
t RAL t ASC t CAH
ADDRESS
Row
Column 1 Column 1 t RWD t AWD t CWD t CWL
Column 2 t CPW t AWD t CWD t CWL
Column N t CWL t CPW t AWD t CWD
t RWL
t RCS
t RCS
WE
WE
t RCS t WP t DS t DZC t DH t DZC t WP t DZC t DS t DH t WP t DS t DH OPEN
DQ1~DQ4
OPEN
DIN 1
OPEN
DIN 2
DIN N
t DZO t DZO t OED t OEH t OED t OEH
t DZO
t OED
t OEH
OE
t OEA t CAC t RAC t AA t OEZ t OEA t CAC t AA t CPA t OEZ t CAC t AA t CPA t OEZ t OEA
DQ1~DQ4
DOUT 1 DOUT
2
DOUT
N
Rev.1
Page 22
* Read Cycle with WE Controlled Disable
RAS
t CSH t RCD t T t CAS
CAS
t RAD t ASR t RAH t ASC t CAH
ADDRESS
Row
Column
t RCS
t RCH
t WPZ
WE
t WHZ
OE
t DS tOEA tCAC t AA t RAC tOEZ
DQ1~DQ4
tCLZ
DOUT
Rev.1
Page 23
RAS-Only Refresh Cycle
t RC t RAS t RP
RAS
tT t CRP tRPC tCRP
CAS
tASR
tRAH
ADDRESS
ROW
tOFF OPEN
DQ1~DQ4
CAS-Before-RAS Refresh Cycle
tRC tRP tRAS tRP t RAS
tRC t RP
RAS
tRPC
tT t CSR t CHR
tRPC tCSR t CHR
tCRP
CAS
tWSR tWHR tWSR tWHR
WE
tOFF OPEN
DQ1~DQ4
Rev.1
Page 24
CBR Self-Refesh Cycle
t RASS
t RPS
RAS
t RPC t CSR tCHS
CAS
tOFF
High lmpedance
DQ1~DQ4
tWSR
tWHR
WE
OPEN
Rev.1
Page 25
* Hidden Refresh Cycle
t RC tRAS
(READ)
t RC t RP tRAS
(REFRESH)
t RC t RP tRAS
(REFRESH)
t RP
RAS
tT
t CHR t RSH t RCD tCAS
tCRP
CAS
t RAD t ASR t RAH tASC
t RAL tCAH
ADDRESS
ROW
COlumn
tRRH t RCS tRCH
WE
OE
t OEA t CAC t AA t RAC t OEZ t OFF t OFF
DQ1~DQ4
D OUT
Rev.1
Page 26
Ordering information Part Number AD404M42VSA-5 AD404M42VSA-6 AD404M42VTA-5 AD404M42VTA-6 AD404M42VSA-5 * AD
* 40 * 4M4 *2 *V
Access time 50 ns 60 ns 50 ns 60 ns
Package
300mil 26/24-Pin Plastic SOJ TSOP II
* Ascend Memory Product * Device Type * Density and Organization * Refresh Rate, 2: 2K Refresh * T: 5V, V: 3.3V * Package Type (S : SOJ, T : TSOP II) * Version
* Speed (5: 50 ns, 6: 60 ns)
*S *A
*5
Packaging information
* 300 mil, 26/24-Pin Plastic SOJ
D DIM A A1 A2 b b1 b2 c c1 D E E1 E2 e R1 MILLIMETERS INCHES MIN. NOM. MAX. MIN. NOM. MAX. 3.25 3.51 3.76 0.128 0.138 0.148 2.08 ----0.082 ----2.54 REF. 0.100 REF. 0.41 0.41 0.66 0.18 0.18 17.02 --0.46 --0.51 0.48 0.81 0.016 0.016 0.026 0.007 0.007 0.670 --0.018 --0.020 0.019 0.032 1 6 8 13 b 26 21 19 14 b1
c1 c E1 E BASE METAL WITH PLATING
--0.30 --0.28 17.15 17.27 8.51 BASIC 7.49 7.62 7.75 6.78 BASIC 1.27 BASIC 0.76 --1.02
--0.012 0.011 --0.675 0.680 0.335 BASIC 0.295 0.300 0.305 0.267 BASIC 0.050 BASIC 0.030 --0.040
SECTION B-B
C L
A2
0.025" MIN. A A1
B B E2
NOTE: 1. CONTROLLING DIMENSION : INCHES 2. DIMENSION D DOES NOT INCLUDE MOLD PROTRUSION. MOLD PROTRUSION SHALL NOT EXCEED 0.006"(0.15mm) PER SIDE. DIMENSION E1 DOES NOT INCLUDE INTERLEAD PROTRUSION. INTERLEAD PROTRUSION SHALL NOT EXCEED 0.01"(0.25mm) PER SIDE. 3. DIMENSION b2 DOES NOT INCLUDE DAMBAR PROTRUSION OR INTRUSION. DAMBAR PROTRUSION SHALL NOT CAUSE THE SHOULDER WIDTH TO EXCEED b2 MAX BY MORE THAN 0.005"(0.127mm) DAMBAR INTRUSION SHALL NOT REDUCE THE SHOULDER WIDTH TO LESS THAN 0.001"(0.025mm) BELOW b2 MIN.
e b2 b 0.007"M 4-e 0.004"
RAD R1 SEATING PLANE
Rev.1
Page 27
* 300 mil, 26/24-Pin TSOP II
DIM A A1 A2 b b1 c c1 D ZD e E E1 L R R1
MILLIMETERS MIN. --0.05 0.95 0.30 0.30 0.12 0.12 17.01 NOM. ----1.00 --0.40 --0.15 17.14 0.95 REF. 1.27 BASIC 9.02 7.49 0.40 0.12 0.12 9.22 7.62 0.50 ----9.42 7.75 0.60 0.25 --0.355 0.295 0.016 0.005 0.005 MAX. 1.20 0.15 1.05 0.52 0.45 0.21 0.16 17.27 MIN. --0.002 0.037 0.012 0.012 0.005 0.005 0.670
INCHES NOM. ----0.039 --0.016 --0.006 0.675 0.050 BASIC 0.363 0.300 0.020 ----0.371 0.305 0.024 0.010 --(ZD) A MAX. 0.047 0.006 0.041 0.020 0.018 0.008 (0.006) 0.680 1 6 D 8 13 b b1 E1 E A1 26 21 19 14 A2
RAD R1 RAD R B B c
DETAIL A
L
0 ~5
0.0374 BASIC
SECTION B-B
c
c1
BASE METAL WITH PLATING DETAIL A
NOTE: 1. CONTROLLING DIMENSION : MILLIMETERS 2. DIMENSION D DOES NOT INCLUDE MOLD PROTRUSION. MOLD PROTRUSION SHALL NOT EXCEED 0.15(0.006") PER SIDE. DIMENSION E1 DOES NOT INCLUDE INTERLEAD PROTRUSION. INTERLEAD PROTRUSION SHALL NOT EXCEED 0.25(0.01") PER SIDE. 3. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSIONS/INTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL NOT CAUSE THE LEAD TO BE WIDER THAN THE MAX b DIMENSION BY MORE THAN 0.13mm. DAMBAR INTRUSION SHALL NOT CAUSE THE LEAD TO BE NARROWER THAN THE MIN b DIMENSION BY MORE THAN 0.07mm.
4-1.27 REF. b 0.200(0.008")
M
e SEATING PLANE 0.100(0.004")
Rev.1
Page 28


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